> 5.12.2 | Pin I/O

> The pin I/O test was designed to find out how fast a Java MIDlet can process URCs caused by Pin I/O and react to these URCs. The URCs are generated by feeding an input pin with an external frequency. As soon as the Java MIDlet is informed about the URC, it tries to regenerate the feeding frequency by toggling another output pin.
> Figure 14: Test case for measuring Java MIDlet performance and handling pin-IO
> The results of this test show that the delay from changing the state on the input pin to a state change on the output pin is at least around 50 ms, but that time strongly depends on the amount of garbage to collect and number of threads to be served by the virtual machine. Consequently, pin I/O is not suitable for generating or detecting frequencies.